Thermal-Aware Testing of Digital VLSI Circuits and Systems

English | 2018 | ISBN: 978-0815378822 | 138 Pages | PDF | 10 MB

This book aims to highlight the research activities in the domain of thermal-aware testing. Thermal-aware testing can be employed both at circuit level and at system level. This book will be suitable for researchers working on power- and thermal-aware design and the testing of digital VLSI chips.

• VLSI Testing: An Introduction
• Circuit-Level Testing
• Test-Data Compression
• System-on-Chip Testing
• Network-on-Chip Testing